一、X-Ray测量镀层厚度 X-Ray Coating Thickness Measurement:
测试标准依据：GB/T 16921-2005《金属覆盖层 厚度测量X射线光谱方法》（ISO 3479：2000，IDT)
Testing Basis Standard: GB/T 16921-2005 "Metallic coatings—Measurement of coating thickness—X-ray spectrometric methods" (ISO 3479:2000, IDT)
测量方法:使用X－Ray荧光光谱仪测量覆盖层的厚度，是利用X－Ray轰击覆盖层，然后接收器接受到覆盖层中元素的特征X谱线，根据接受到谱线能量的大小，再与系统中预先设定的同元素能量大小及对应的厚度值进行比较，计算出各个覆盖层的厚度。
Measurement Method: The measurement of coating thickness using an X-ray fluorescence (XRF) spectrometer involves bombarding the coating with X-rays. The detector receives the characteristic X-ray spectra emitted by elements within the coating. The thickness of each coating layer is determined by comparing the energy intensity of the detected spectra with predetermined values of energy intensity and corresponding thickness for the same elements stored in the system.
适用范围Scope of Application:使用X射线荧光光谱仪对电镀层的厚度进行测量。
Measurement of electroplated coating thickness using an X-ray fluorescence spectrometer.
测试范围Test Range：理论最小测量值0.1μm
Theoretical minimum measurable thickness: 0.1 μm
二、(显微镜法)镀层厚度测量 (Microscopic Method) Coating Thickness Measurement：
测量方法Measurement Method:使用金相显微镜测量覆盖层的厚度，是利用显微镜将覆盖层的横截面放大至1000倍以上，直接在显示屏上显示覆盖层，然后用鼠标移动十字交叉线分别瞄准覆盖层的起始线、分界线和终结线，测量出各个覆盖层的厚度。
The thickness of the coating is measured with a metallurgical (metallographic) microscope by enlarging a cross-section of the coating to 1000× or higher and displaying the image on the monitor. The crosshair cursor is then moved with the mouse to coincide successively with the coating’s start boundary, interlayer interface(s), and end boundary, from which the thickness of each coating layer is obtained.
测试范围：理论最小测量值1μm
Test Range: Theoretical minimum measurable thickness: 1 μm
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